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基于检测正确率成败型系统可靠性的近似置信限
引用本文:叶秀芬,郑海鹰. 基于检测正确率成败型系统可靠性的近似置信限[J]. 科学技术与工程, 2008, 8(2): 476-480
作者姓名:叶秀芬  郑海鹰
作者单位:温州大学数学与信息科学学院,温州,325035;温州大学数学与信息科学学院,温州,325035
摘    要:
讨论了检测正确率小于l的情况下,按检测数据由独立的成败型元件组成的串并联系统及并串联系统可靠性的近似置信下限.利用系统诸元件的试验数据,在一、二阶矩拟合的原则下,将其折合为原系统的伪试验数和伪成功数;然后,利用单个成败型元件可靠性的经典精确置信下限作为原系统可靠性置信下限的近似值;给出了伪试验数和伪成功数的推导公式,最后给出了模拟计算实例,说明该方法可行.

关 键 词:串并联系统  并串联系统  检测正确率  可靠性  置信限
收稿时间:2007-10-08
修稿时间:2007-10-08

Approximate Solution for Lower Confidence Limits of Reliability for Systems with Pass-fail Components Based on the Correctness of Test
YE Xiu-fen,ZHENG Hai-ying. Approximate Solution for Lower Confidence Limits of Reliability for Systems with Pass-fail Components Based on the Correctness of Test[J]. Science Technology and Engineering, 2008, 8(2): 476-480
Authors:YE Xiu-fen  ZHENG Hai-ying
Abstract:
Consuming that the correctness of the test is less than 1, the approximate solution of lower confidence limits of reliability for series-parallel and parallel-series systems which are composed of pass,fail components inde-pendently are consiered. Based on the test data, the lower confidence limits within the rule of fitting the order one and the order two moment is calculated. At last, the simulated computation to examine the feasibility of the approx-imate method is made.
Keywords:series-parallel system   parallel-series system   correctness of the test   reliability   con-fidence
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