X衍射线晶粒加宽线形分析的研究

从晶粒大小分布函数的假定出发，结合Ｆｏｕｒｉｅｒ分析方法的原理，导出了描述Ｘ射线衍射线形的积分表达式，并以此同实验测出的衍射线形进行拟合，结果同传统的Ｆｏｕｒｉｅｒ分析方法得出的结果符合得很好。由于采用了拟合法以及理论上得到的更为符合实际的线形积分表达式，就可以避免传统Ｆｏｕｒｉｅｒ分析方法所产生的弯钩效应，克服把柯西线形近似为晶粒加宽线形的不足，使得最后晶粒大小结果更为准确。

STUDIES ON ANALYSIS OF PARTICLE-BROADENED X-RAY DIFFRACTION LINE PROFILE

By presuming the distribution function of particle sizes (or column height) and combining the theory of traditional Fourier analysis method, the authors work out an integral expression which discribes the line profile of X-ray diffraction, and then use it to fit the experimental line profile, it is finally found that the result from the fit- ting method agrees with that from the traditional Fourier analysis method very well. Because the fitting method and the more precise expression of the line profile are adopted, the hook effect of Fourier method can be avoided and the shortcoming of Cauchy function which discribes the particle-broadedned line profile can be over- comed, and the final result will be more precise.