| 静电放电危害及防护技术研究 |
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| 引用本文： | 薛纯,王耀军.静电放电危害及防护技术研究[J].科技信息,2010(31):I0076-I0077. |
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| 作者姓名： | 薛纯 王耀军 |
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| 作者单位： | 陕西航天导航设备有限公司,陕西宝鸡721006 |
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| 摘 要： | 静电放电会使电子元器件失效或存在隐患,它对电子产品的生产和组装会造成难以预测的危害。在介绍静电产生的原因及静电放电对电子产品造成的危害基础上,重点探讨了静电放电的防护技术。
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| 关 键 词： | 电子产品 静电放电 危害 防护 |
Research on the Perniciousness and Protection Technology of ESD |
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| XUE Chun,WANG Yao-jun.Research on the Perniciousness and Protection Technology of ESD[J].Science,2010(31):I0076-I0077. |
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| Authors: | XUE Chun WANG Yao-jun |
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| Institution: | (Shannxi Aerospace Navigation Equipment Co.Ltd., Baoji Shanxi, 721006, China) |
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| Abstract: | Electronic components are to be disabled or damaged if there is ESD, many uncertain damage of electronic production result from ESD. The states is base on the reason of static producting and the damage of production by ESD, and focus on the protection technology of ESD. |
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| Keywords: | Electronic production ESD Perniciousness protecting |
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