| 电荷耦合器件型折射率测定仪的研制 |
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| 引用本文： | 孙文光,章昌奕,马宁生.电荷耦合器件型折射率测定仪的研制[J].同济大学学报(自然科学版),2006,34(7):981-984. |
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| 作者姓名： | 孙文光 章昌奕 马宁生 |
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| 作者单位： | 同济大学,物理系,上海,200092 |
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| 基金项目： | 同济大学校科研和教改项目 |
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| 摘 要： | 基于折射定律设计光路，利用线阵电荷耦合器件（CCD）对光斑位移进行检测，研制成功小型的能够测量透明介质折射率的仪器，设计的测量折射率的范围显著增加．介绍了该仪器设计的基本原理、使用方法，并通过对一些材料折射率的测量，证明其具有较高的测量准确性．
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| 关 键 词： | 折射率 线阵电荷耦合器件 位移测量 |
| 文章编号： | 0253-374X（2006）07-0981-04 |
| 收稿时间： | 12 14 2004 12:00AM |
| 修稿时间： | 2004-12-14 |
Development of Apparatus with a Linear Charge-Coupled Device Array to Measure Refractive Index |
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| SUN Wenguang,ZHANG Changyi,MA Ningsheng.Development of Apparatus with a Linear Charge-Coupled Device Array to Measure Refractive Index[J].Journal of Tongji University(Natural Science),2006,34(7):981-984. |
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| Authors: | SUN Wenguang ZHANG Changyi MA Ningsheng |
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| Institution: | Department of Physics, Tongji University, Shanghai 200092, China |
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| Abstract: | Using the linear charge-coupled device(CCD) array to measure the displacement of the refractive ray spot on the basis of the refraction law,we have designed a pint-sized apparatus to measure the refractive index of some transparent material.The designed measurable range of the refractive index is improved greatly.The designing principle and usage of the apparatus are explained in this paper.Measurement of the refractive index of some materials shows that the apparatus is of high measuring accuracy. |
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| Keywords: | refractive index linear charge-coupled array displacement measure |
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