The reliability of high range accelerometer was directly effected by the memory circuit’s anti-impact ability, which is an important part of the high range accelerometer. The paper in the basis of theoretical analysis the failure mode and mechanism of the memory circuit under impact environment, ANSYS/LS-DYNA was used to simulate the anti-impact ability of the memory circuit. The impact testing was completed in the range of 0-40000g.The testing results show that the circuit was failure under 19750g impact. accelerometer．The reliability of the high range accelerometer measurement board can be evaluated by stress—strength interference mode．